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DQE affects the image quality of amorphous silicon X-ray flat panel detectors
To judge the image quality of X-ray flat panel detectors, it is usually measured by modulation transfer function (MTF) and quantum conversion efficiency (DQE). High MTF and DQE values indicate that the image quality produced by the X-ray flat panel detector can achieve better spatial resolution and density resolution.
Factors affecting the DQE of X-ray flat panel detectors: Quantum detection efficiency (DQE) is an expression of the transmission capability of imaging system signals and noise from input to output, expressed as a percentage. DQE reflects the sensitivity, noise, X-ray dose and density resolution of X-ray flat panel detectors. In the amorphous silicon X-ray flat panel detector, there are two main factors that affect DQE: the coating of the scintillator and the transistor that converts visible light into electrical signals.
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