Amorphous silicon flat-panel detectors are also called cesium iodide flat-panel detectors. The basic working principle is that X-rays are first converted into visible light through a fluorescent medium, and then the visible light signal is converted into an electrical signal through a photosensitive element, and finally into a digital signal.
Amorphous silicon flat panel detectors have relatively high conversion efficiency, relatively high dynamic range, and high spatial resolution, and can be used in most scenarios.
But in the case of high X-ray dose, the DQE of its imaging is not as good as that of amorphous selenium. Moreover, in the process of turning the X-rays through the fluorescent layer, the phenomenon of scattering will occur, and the imaging sharpness is lower than that of amorphous selenium.