For the same type of X-ray flat panel detector, at different spatial resolutions, its DQ E is variable; the limit of DQE is high, which does not mean that DQ E is high at any spatial resolution. The calculation formula of DQ E of X-ray flat panel detector is as follows:
DQE = S 2 ×M F T 2 /N SP × X × C
S: average signal intensity; M T F: modulation transfer function; X: X-ray exposure intensity; NPS: system noise power spectrum; C: X-ray quantum coefficient
From the calculation formula, we can see that different M TF values correspond to different DQEs, that is to say, there are different DQEs at different spatial resolutions. The limit DQE of indirect conversion X-ray flat-panel detectors is relatively high, but as the spatial resolution increases, its DQE decreases more; while the limit DQE of direct conversion X-ray flat-panel detectors is not as good as that of indirect conversion X-ray flat-panel detectors. The limit DQ E is high, but as the spatial resolution increases, its DQ E declines more gently. At high spatial resolution, the DQE exceeds the indirect conversion X-ray flat panel detector. This characteristic shows that the indirect X-ray flat panel detector has a strong ability to distinguish differences in tissue density; while the direct conversion X-ray flat panel detector has a higher ability to distinguish subtle structural differences.
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