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How do amorphous silicon and amorphous selenium technologies differ in X-ray flat panel detectors?

Amorphous silicon (a-Si) and amorphous selenium (a-Se) are two distinct technologies employed in X-ray flat panel detectors (FPDs), differing in their fundamental mechanisms of converting X-ray energy into electrical signals. Amorphous silicon detectors utilize a scintillator layer to absorb X-rays, converting them into visible light. This light is then detected by a layer of a-Si, which transforms it into electrical signals through a process known as photoconduction. On the other hand, amorphous selenium detectors directly convert X-ray photons into electrical charges through a process called photoelectric conversion. A-Si detectors typically offer higher spatial resolution due to their smaller pixel sizes, while a-Se detectors are known for their efficiency in capturing X-rays, making them suitable for high-dose applications. The choice between these technologies depends on specific imaging requirements, considering factors such as resolution, dose efficiency, and cost. We are a manufacturer of X-ray machines and their accessories. If you have any needs for FPDs, please feel free to contact us. Whatsapp:+86 18953613955. Email: service@newheek.com

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