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CCD, one-line scanning, and amorphous flat panel three major technologies of X-ray flat panel detectors?

According to the constituent materials and working principles of X-ray flat-panel detectors, X-ray flat-panel detectors are mainly divided into three major technologies: CCD, one-line scanning, and amorphous flat panel.

1.One-line scanning X-ray flat panel detector: also known as one-dimensional line scanning technology, invented by the Institute of Nuclear Physics of the Russian Academy of Sciences, which is the DR produced by ZTE Aerospace in China; it has the advantages of low radiation dose and lower equipment cost than flat panel technology , But there are also fatal flaws such as long imaging time (several seconds), low spatial resolution (1mm/lp when it was first launched), and low X-ray use efficiency; the imaging quality is poor and the patient will receive a lot of unnecessary radiation

2.Amorphous X-ray flat panel detector: amorphous selenium/amorphous silicon; mainly composed of amorphous selenium layer (a-Se)/amorphous silicon layer (a-Si) plus thin film semiconductor array (TFT).

3.CCD X-ray flat panel detector: Due to physical limitations, experts generally believe that large-area flat panel imaging CCD technology is not adequate, and CCD equipment has a certain gap in image quality compared with amorphous silicon/selenium flat panel equipment, but it has a relative price advantage ; There are still several manufacturers in the world using this technology such as Swissray.

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