Since amorphous selenium is an optical conductive material, it can directly generate electrical signals after receiving X-ray exposure, thus avoiding the phenomenon of scattering light in the indirect conversion mode and reducing the spatial resolution of the graph.
Due to its morphological and structural characteristics, the flat plate detector has the advantages of high airborne resolution, good image sharpness and high conversion efficiency. However, due to its direct quasi-exchange of X rays, the absorption efficiency of X is low.
Therefore, the image quality cannot be well guaranteed under the condition of low dose X-ray.Due to the fact that the direct type flat plate detector is sensitive to temperature due to the non-crystal selenium, the direct type flat plate X-ray detector has some limitations on its environmental requirements.
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