The performance index for evaluating the imaging quality of x-ray detector flat panel is quantum detection efficiency.
The quantum detection efficiency determines the resolution of x-ray detector flat panel for different tissue density differences, while the spatial resolution determines the resolution of tissue microstructure. The quantum detection efficiency and spatial resolution can be used to evaluate the imaging capabilities of flat panel detectors.
In indirect-converted flat panel detectors, there are two main factors that affect the efficiency of quantum detection: the coating of the scintillator and the transistor that converts visible light into an electrical signal.
In a direct conversion x-ray detector flat panel, the conversion of the X-ray into an electrical signal is completely dependent on the electron-hole pairs generated by the amorphous selenium layer. The quantum detection efficiency depends on the ability of the amorphou s selenium layer to generate charge.