Scintillator CsI 17*17 X-ray flat panel detectors
There are two main performance indicators for evaluating the imaging quality of X-ray flat panel detectors: quantum detection efficiency and spatial resolution. DQ E determines the ability of the flat panel detector to distinguish the density difference of different tissues; and the spatial resolution determines the ability to distinguish the fine structure of the tissue. The imaging capabilities of flat panel detectors can be evaluated by examining DQ E and spatial resolution.
In the indirect conversion X-ray flat panel detector, there are two main factors that affect DQE: the coating of the scintillator and the transistor that converts visible light into electrical signals.
X-ray flat panel detector technology: a-Si / a-Si
X-ray flat panel Scintillator: GOS / CsI
X-ray flat panel Image size: 43 × 43cm
X-ray flat panel Pixel matrix: 3072 × 3072
X-ray flat panel Pixel pitch: 140µm
X-ray flat panel A / D conversion: 16bit
X-ray flat panel Spatial resolution: 3.6 LP / mm
X-ray flat panel Image acquisition time (wired / wireless): 1s / 2 ~ 3s
X-ray flat panel Dimensions: 46 × 46 × 1.5 cm
Weight (wireless / wired with battery): 3.9kg / 4.5kg
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