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Principle analysis of digital X-ray machine DR detector

DR detectors are the core components of digital X-ray machines. DR detectors can be divided into two types of energy conversion methods: indirect FPD and direct FPD.

1. Indirect conversion DR detector

The structure of the indirect FPD is mainly composed of a scintillator or phosphor layer plus an amorphous silicon layer (a-Si) with a photodiode function and a TFT array. The principle is that after the scintillator or phosphor layer is exposed to X-rays, the X-ray photons are converted into visible light, and then the amorphous silicon layer with photodiode function is converted into image electrical signals, and finally a digital image is obtained.

Indirect conversion DR detectors usually have the following structures:

①Cesium iodide (CsI) + a-Si (amorphous silicon) + TFT

②Sulfur oxidation (Gd2O2S) + a-Si (amorphous silicon) + TFT

③Cesium iodide (CsI) / Gadolinium oxysulfide (Gd2O2S) + lens / optical fiber + CCD / CMOS

④ CsI (Gd2O2S) + CMOS

2. Direct conversion flat panel detector

The direct conversion DR detector is mainly a DR detector composed of an amorphous selenium layer (a-Se) and a thin film semiconductor array (TFT).

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