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How do indirect and direct conversion flat panel detectors differ in their image acquisition mechanisms?

Indirect and direct conversion X-ray flat panel detectors differ in their image acquisition mechanisms primarily in how they convert X-ray energy into electrical signals.

Direct conversion detectors utilize materials like amorphous selenium, which directly converts X-rays into electrical charges. When X-rays strike the detector, they create electron-hole pairs within the selenium, generating a charge directly proportional to the incident X-ray intensity. This charge is then read out and processed to form the image.

In contrast, indirect conversion detectors use materials such as amorphous silicon coupled with scintillator layers. X-rays first interact with the scintillator layer, causing it to emit light photons. These photons then strike a photodiode array, where they are converted into electrical signals. This two-step process involves conversion of X-rays to light and then light to electrical signals.

While direct conversion offers potentially higher spatial resolution and sensitivity due to the elimination of light conversion, indirect conversion detectors are often favored for their lower production costs and wider availability. We are a manufacturer of X-ray machines and their accessories. If you have any needs for FPDs, please feel free to contact us. Whatsapp:+86 18953679166. Email: service@newheek.com

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